Reliability prediction for microelectronics

Main Author: Bernstein, Joseph B.
Other Authors: Bensoussan, Alain, Bender, Emmanuel
Subjects:
Online Access: http://library.unisel.edu.my/web/guest/mylibrary
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090 0 0 |a TK7874   |b .B47 2024 
100 1 |a Bernstein, Joseph B.  
245 1 0 |a Reliability prediction for microelectronics   |c Joseph B. Bernstein, Alain A. Bensoussan, and Emmanuel Bender. 
264 |a Hoboken, NJ:   |b Wiley,   |c 2024. 
300 |a 1 online resource (400 pages):   |b text file, PDF. 
336 |a text  |2 rdacontent 
337 |a computer  |2 rdamedia 
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650 0 |a Microelectronics --   |x Reliability  
655 0 |a Electronic books 
700 1 |a Bensoussan, Alain  
700 1 |a Bender, Emmanuel  
856 4 2 |u http://library.unisel.edu.my/web/guest/mylibrary 
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998 |a Electronics Engineering, Degree 
999 |a EBO0023512  |b EBOOK  |c EBOOK  |e Electronic resources