Reliability prediction for microelectronics
Main Author: | Bernstein, Joseph B. |
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Other Authors: | Bensoussan, Alain, Bender, Emmanuel |
Subjects: | |
Online Access: |
http://library.unisel.edu.my/web/guest/mylibrary |
Internet
http://library.unisel.edu.my/web/guest/mylibraryElectronic resources
Call Number: |
TK7874 B47 2024 |
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Accession No | Item Category | SMD | Status | Notes |
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EBO0023512 | EBOOK | EBOOK | AVAILABLE |