Reliability prediction for microelectronics

Main Author: Bernstein, Joseph B.
Other Authors: Bensoussan, Alain, Bender, Emmanuel
Subjects:
Online Access: http://library.unisel.edu.my/web/guest/mylibrary

Internet

http://library.unisel.edu.my/web/guest/mylibrary

Electronic resources

Call Number: TK7874 B47 2024
Accession No Item Category SMD Status Notes
EBO0023512 EBOOK EBOOK AVAILABLE