Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach
Main Author: | Li, Xiaowei |
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Other Authors: | Yan, Guihai, Liu, Cheng |
Subjects: | |
Online Access: |
http://library.unisel.edu.my/web/guest/mylibrary |
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