Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach
| Main Author: | Li, Xiaowei |
|---|---|
| Other Authors: | Yan, Guihai, Liu, Cheng |
| Subjects: | |
| Online Access: |
http://library.unisel.edu.my/web/guest/mylibrary |