Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach
| Main Author: | Li, Xiaowei |
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| Other Authors: | Yan, Guihai, Liu, Cheng |
| Subjects: | |
| Online Access: |
http://library.unisel.edu.my/web/guest/mylibrary |
| Physical Description: |
1 online resource (318 pages): text file, PDF. |
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| ISBN: |
9789811985515 (electronic book) |