Li, X., Yan, G., & Liu, C. Built-in fault-tolerant computing paradigm for resilient large-scale chip design: A self-test, self-diagnosis, and self-repair-based approach.

Li, Xiaowei, Guihai Yan, and Cheng Liu. Built-in Fault-tolerant Computing Paradigm for Resilient Large-scale Chip Design: A Self-test, Self-diagnosis, and Self-repair-based Approach.

Li, Xiaowei, Guihai Yan, and Cheng Liu. Built-in Fault-tolerant Computing Paradigm for Resilient Large-scale Chip Design: A Self-test, Self-diagnosis, and Self-repair-based Approach.