Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach
| Main Author: | Li, Xiaowei |
|---|---|
| Other Authors: | Yan, Guihai, Liu, Cheng |
| Subjects: | |
| Online Access: |
http://library.unisel.edu.my/web/guest/mylibrary |
Internet
http://library.unisel.edu.my/web/guest/mylibraryElectronic resources
| Call Number: |
TK7874 L59 2023 |
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| Accession No | Item Category | SMD | Status | Notes |
|---|
| EBO0022407 | EBOOK | EBOOK | AVAILABLE |