Soft error reliability of VLSI circuits : analysis and mitigation techniques

Main Author: Ghavami, Behnam
Other Authors: Raji, Mohsen
Subjects:
Online Access: http://library.unisel.edu.my/web/guest/mylibrary
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020 |a 9783030516109 (electronic book)  
090 0 0 |a TK7874.75   |b .G43 2021 
100 1 |a Ghavami, Behnam  
245 1 0 |a Soft error reliability of VLSI circuits :   |b analysis and mitigation techniques   |c Behnam Ghavami, Mohsen Raji. 
264 |a Switzerland:   |b Springer,   |c 2021. 
300 |a 1 online resource (xiii, 114 pages):   |b illustrations, text file, PDF. 
336 |a text  |2 rdacontent 
337 |a computer  |2 rdamedia 
338 |a online resource  |2 rdacarrier 
650 0 0 |a Integrated circuits --   |x Very large scale integration --   |x Reliability  
650 0 0 |a Electronic circuits  
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700 1 |a Raji, Mohsen  
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997 |a Engineering & Life Sciences, Faculty  |b Engineering, Department 
999 |a EBO0012878  |b EBOOK  |c EBOOK  |e Electronic resources