Holdings: Soft error reliability of VLSI circuits :

Main Author:	Ghavami, Behnam
Other Authors:	Raji, Mohsen
Subjects:	Integrated circuits -- > Very large scale integration -- > Reliability Electronic circuits Electronic books
Online Access:	http://library.unisel.edu.my/web/guest/mylibrary

Call Number:	TK7874 75 G43 2021

Accession No	Item Category	SMD	Status	Notes

EBO0012878

EBOOK

AVAILABLE