Trends in development of accelerated testing for automotive and aerospace engineering
by: Klyatis, Lev M
Next generation HALT and HASS : robust design of electronics and systems
| Main Author: | Gary, Kirk A |
|---|---|
| Other Authors: | Paschkewitz, John J. |
| Series: |
Wiley series in quality & reliability engineering
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| Subjects: | |
| Online Access: |
http://library.unisel.edu.my/web/guest/mylibrary |