Next generation HALT and HASS : robust design of electronics and systems
| Main Author: | Gary, Kirk A |
|---|---|
| Other Authors: | Paschkewitz, John J. |
| Series: |
Wiley series in quality & reliability engineering
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| Subjects: | |
| Online Access: |
http://library.unisel.edu.my/web/guest/mylibrary |
Internet
http://library.unisel.edu.my/web/guest/mylibraryElectronic resources
| Call Number: |
TA169 3 G39 2016 |
|---|
| Accession No | Item Category | SMD | Status | Notes |
|---|
| EBO0010172 | EBOOK | EBOOK | AVAILABLE |