Next generation HALT and HASS : robust design of electronics and systems
| Main Author: | Gary, Kirk A |
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| Other Authors: | Paschkewitz, John J. |
| Series: |
Wiley series in quality & reliability engineering
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| Subjects: | |
| Online Access: |
http://library.unisel.edu.my/web/guest/mylibrary |
| Physical Description: |
1 online resource (xvii, 276 pages): illustrations, text file, PDF. |
|---|---|
| ISBN: |
9781118700235 (electronic book) |