|
|
|
|
LEADER |
00996cam a2200253 7i4500 |
001 |
0000064848 |
005 |
20211222090000.0 |
020 |
|
|
|a 9780815378822
|
020 |
|
|
|a 9781351227780 (electronic book)
|
090 |
0 |
0 |
|a TK7874.75
|b .C46 2018
|
100 |
1 |
|
|a Chattopadhyay, Santanu
|
245 |
1 |
0 |
|a Thermal-aware testing of digital VLSI circuits and systems
|c Santanu Chattopadhyay.
|
250 |
|
|
|a First edition.
|
264 |
|
|
|a Boca Raton, FL:
|b Taylor & Francis Group,
|c 2018.
|
300 |
|
|
|a 1 online resource (xx, 117 pages):
|b text file, PDF.
|
336 |
|
|
|a text
|2 rdacontent
|
337 |
|
|
|a computer
|2 rdamedia
|
338 |
|
|
|a online resource
|2 rdacarrier
|
650 |
0 |
0 |
|a Integrated circuits --
|x Very large scale integration --
|x Testing
|
650 |
0 |
0 |
|a Digital integrated circuits --
|x Testing
|
655 |
0 |
0 |
|a Electronic books
|
856 |
4 |
2 |
|u http://library.unisel.edu.my/web/guest/mylibrary
|
997 |
|
|
|a Engineering & Life Sciences, Faculty
|b Engineering, Department
|
999 |
|
|
|a EBO0009548
|b EBOOK
|c EBOOK
|e Electronic resources
|