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Thermal-aware testing of digital VLSI circuits and systems

Main Author: Chattopadhyay, Santanu
Edition: First edition.
Subjects:
Integrated circuits -- > Very large scale integration -- > Testing
Digital integrated circuits -- > Testing
Electronic books
Online Access: http://library.unisel.edu.my/web/guest/mylibrary
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Physical Description: 1 online resource (xx, 117 pages): text file, PDF.
ISBN: 9780815378822
9781351227780 (electronic book)

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