Nanometer-scale defect detection using polarized light
| Main Author: | Dahoo, Pierre Richard |
|---|---|
| Other Authors: | Pougnet, Philippe, El Hami, Abdelkhalak |
| Series: |
Reliability of multiphysical systems set;
v. 2 Mechanical engineering and solid mechanics series |
| Subjects: | |
| Online Access: |
http://library.unisel.edu.my/web/guest/mylibrary |
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