Nanometer-scale defect detection using polarized light
Main Author: | Dahoo, Pierre Richard |
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Other Authors: | Pougnet, Philippe, El Hami, Abdelkhalak |
Series: |
Reliability of multiphysical systems set;
v. 2 Mechanical engineering and solid mechanics series |
Subjects: | |
Online Access: |
http://library.unisel.edu.my/web/guest/mylibrary |