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| LEADER |
01111cam a2200277 7i4500 |
| 001 |
0000061489 |
| 005 |
20210902090000.0 |
| 020 |
|
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|a 9781848219366 (electronic book)
|
| 090 |
0 |
0 |
|a TA409
|b .D34 2016
|
| 100 |
1 |
|
|a Dahoo, Pierre Richard
|
| 245 |
1 |
0 |
|a Nanometer-scale defect detection using polarized light
|c Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami.
|
| 264 |
|
|
|a London:
|b ISTE,
|c 2016.
|
| 300 |
|
|
|a 1 online resource (296 pages):
|b illustrations, text file, PDF.
|
| 336 |
|
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|a text
|2 rdacontent
|
| 337 |
|
|
|a computer
|2 rdamedia
|
| 338 |
|
|
|a online resource
|2 rdacarrier
|
| 490 |
0 |
|
|a Reliability of multiphysical systems set;
|v v. 2
|
| 490 |
0 |
|
|a Mechanical engineering and solid mechanics series
|
| 650 |
|
0 |
|a Materials --
|x Defects --
|x Analysis
|
| 655 |
|
0 |
|a Electronic books
|
| 700 |
1 |
|
|a Pougnet, Philippe
|
| 700 |
1 |
|
|a El Hami, Abdelkhalak
|
| 856 |
4 |
2 |
|u http://library.unisel.edu.my/web/guest/mylibrary
|
| 997 |
|
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|a Engineering & Life Sciences, Faculty
|b Engineering, Department
|
| 998 |
|
|
|a Mechanical Engineering, Degree
|
| 999 |
|
|
|a EBO0006720
|b EBOOK
|c EBOOK
|e Electronic resources
|
