APA Citation

Dahoo, P. R., Pougnet, P., & El Hami, A. Nanometer-scale defect detection using polarized light.

Chicago Style Citation

Dahoo, Pierre Richard, Philippe Pougnet, and Abdelkhalak El Hami. Nanometer-scale Defect Detection Using Polarized Light.

MLA Citation

Dahoo, Pierre Richard, Philippe Pougnet, and Abdelkhalak El Hami. Nanometer-scale Defect Detection Using Polarized Light.

Warning: These citations may not always be 100% accurate.