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Strain-engineered MOSFETs

Main Author:	Maiti, C. K
Subjects:	Metal oxide semiconductor field-effect transistors -- > Reliability Integrated circuits -- > Fault tolerance Electronic books Strains and stresses
Online Access:	http://library.unisel.edu.my/equip-unisel/custom/ebook_catalog/StrainEngineeredMOSFETscompress.pdf

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