Holdings: Strain-engineered MOSFETs

Main Author:	Maiti, C. K
Subjects:	Metal oxide semiconductor field-effect transistors -- > Reliability Integrated circuits -- > Fault tolerance Electronic books Strains and stresses
Online Access:	http://library.unisel.edu.my/equip-unisel/custom/ebook_catalog/StrainEngineeredMOSFETscompress.pdf

Accession No	Item Category	SMD	Status	Notes

EBO0000045

EBOOK

AVAILABLE