Analysis and design of resilient VLSI circuits : mitogating soft errors and process variations

Main Author: Garg, Rajesh
Other Authors: Khatri, Sunil P
Language: English
Published: New York: Springer, 2010.
Subjects:
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001 0000038200
005 20171103090000.0
008 110329 eng
020 |a 9781441909305 (hbk.)  
090 0 0 |a TK874.75   |b .G73 2010 
100 1 |a Garg, Rajesh  
245 1 0 |a Analysis and design of resilient VLSI circuits :   |b mitogating soft errors and process variations   |c Rajesh Garg, Sunil P. Khatri. 
260 |a New York:   |b Springer,   |c 2010. 
300 |a xxii, 212 p.:   |b ill.;   |c 23 cm. 
504 |a Includes bibliographical references and index 
650 0 0 |a Circuits and Systems  
650 0 0 |a Integrated circuits --   |x Very large scale integration  
700 1 |a Khatri, Sunil P  
997 |a Engineering & Life Sciences, Faculty  |b Engineering, Department 
998 |a Electrical Engineering, Degree 
999 |a 0000048721  |b BOK  |c OPEN SHELF  |e 2nd Floor, Bestari Jaya