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00848cam a2200205 7i4500 |
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20170218090000.0 |
| 020 |
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|a 9780863417450
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| 020 |
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|a 0863417450 (pbk.)
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|a TK7874.654
|b .T48 2008
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|a Test and diagnosis of analogue, mixed-signal and RF integrated circuits :
|b the system on chip approach
|c edited by Yichuang Sun.
|
| 260 |
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|a London:
|b Institution of Engineering and Technology,
|c 2008.
|
| 300 |
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|a xx, 389 p.:
|b ill.;
|c 24 cm.
|
| 490 |
1 |
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|a Circuits, devices and systems series;
|v 19
|
| 650 |
0 |
0 |
|a Radio frequency integrated circuits --
|x Testing
|
| 650 |
0 |
0 |
|a Linear integrated circuits --
|x Testing
|
| 650 |
0 |
0 |
|a Mixed signal circuits --
|x Testing
|
| 700 |
1 |
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|a Yichuang, Sun
|
| 997 |
|
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|a Engineering, Faculty
|b Engineering, Department
|
| 999 |
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|a 0000052911
|b BOK
|c OPEN SHELF
|e 1st Floor, Bestari Jaya
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