Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach
| Other Authors: | Yichuang, Sun |
|---|---|
| Published: |
London:
Institution of Engineering and Technology,
2008.
|
| Series: |
Circuits, devices and systems series;
19 |
| Subjects: |
| Physical Description: |
xx, 389 p.: ill.; 24 cm. |
|---|---|
| ISBN: |
9780863417450 0863417450 (pbk.) |