Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach
Other Authors: | Yichuang, Sun |
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Published: |
London:
Institution of Engineering and Technology,
2008.
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Series: |
Circuits, devices and systems series;
19 |
Subjects: |
2nd Floor, Bestari Jaya
Call Number: |
TK7874 654 T48 2008 |
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Accession No | Item Category | SMD | Status | Notes |
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0000052911 | OPEN SHELF | BOK | AVAILABLE |