Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach

Other Authors: Yichuang, Sun
Published: London: Institution of Engineering and Technology, 2008.
Series: Circuits, devices and systems series; 19
Subjects:

2nd Floor, Bestari Jaya

Call Number: TK7874 654 T48 2008
Accession No Item Category SMD Status Notes
0000052911 OPEN SHELF BOK AVAILABLE