|
|
|
|
| LEADER |
00978cam a2200253 7i4500 |
| 001 |
0000031172 |
| 005 |
20171117090000.0 |
| 008 |
091215 eng |
| 020 |
|
|
|a 9781420043761 (hbk.)
|
| 040 |
|
|
|a OhCoOLI
|
| 090 |
0 |
0 |
|a TK7871
|b .D44 2009
|
| 245 |
0 |
0 |
|a Defects in microelectronic materials and devices
|c edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf.
|
| 260 |
|
|
|a Boca Raton:
|b CRC Press,
|c 2009.
|
| 300 |
|
|
|a xvi, 753 p.:
|b ill.;
|c 26 cm.
|
| 504 |
|
|
|a Includes bibliographical references and index
|
| 650 |
0 |
0 |
|a Microelectronics
|
| 650 |
0 |
0 |
|a Metal oxide semiconductor field-effect transistors
|
| 650 |
0 |
0 |
|a Integrated circuits
|
| 700 |
1 |
|
|a Fleetwood, Daniel M.
|
| 700 |
1 |
|
|a Pantelides, Sokrates T.
|
| 700 |
1 |
|
|a Schrimpf, Ronald D.
|
| 997 |
|
|
|a Engineering & Life Sciences, Faculty
|b Engineering, Department
|
| 998 |
|
|
|a Electronics Engineering, Degree
|
| 999 |
|
|
|a 0000035311
|b BOK
|c OPEN SHELF
|e 2nd Floor, Bestari Jaya
|
