Physical principles of electron microscopy : an introduction to TEM, SEM and AEM

Main Author: Egerton, Ray F
Language: English
Published: New York, NY: Springer, 2005.
Subjects:
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020 |a 0387258000 (hbk.)  
020 |a 9780387258003  
040 |a DLC 
090 0 0 |a QH212.E4   |b E34 2005 
100 1 |a Egerton, Ray F  
245 1 0 |a Physical principles of electron microscopy :   |b an introduction to TEM, SEM and AEM   |c Ray F. Egerton. 
260 |a New York, NY:   |b Springer,   |c 2005. 
300 |a xii, 202 p.:   |b ill.;   |c 25 cm. 
504 |a Includes bibliographical references and index 
650 0 0 |a Electron microscopy  
997 |a Health Sciences, Faculty 
999 |a 0000039162  |b BOK  |c OPEN SHELF  |e 1st Floor, Shah Alam