Physical principles of electron microscopy : an introduction to TEM, SEM and AEM
| Main Author: | Egerton, Ray F |
|---|---|
| Language: | English |
| Published: |
New York, NY:
Springer,
2005.
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| Subjects: |
| Physical Description: |
xii, 202 p.: ill.; 25 cm. |
|---|---|
| Bibliography: |
Includes bibliographical references and index |
| ISBN: |
0387258000 (hbk.) 9780387258003 |