APA Citation
Egerton, R. F. (2005). Physical principles of electron microscopy: An introduction to TEM, SEM and AEM. New York, NY: Springer.
Chicago Style CitationEgerton, Ray F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM and AEM. New York, NY: Springer, 2005.
MLA CitationEgerton, Ray F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM and AEM. New York, NY: Springer, 2005.
Warning: These citations may not always be 100% accurate.