Physical principles of electron microscopy : an introduction to TEM, SEM and AEM
| Main Author: | Egerton, Ray F |
|---|---|
| Language: | English |
| Published: |
New York, NY:
Springer,
2005.
|
| Subjects: |
1st Floor, Shah Alam
| Call Number: |
QH212 E4 E34 2005 |
|---|
| Accession No | Item Category | SMD | Status | Notes |
|---|
| 0000039162 | OPEN SHELF | BOK | AVAILABLE |