|
|
|
|
| LEADER |
00993cam a2200229 7i4500 |
| 001 |
0000024054 |
| 005 |
20180420090000.0 |
| 008 |
080905 eng |
| 090 |
0 |
0 |
|a TK5101
|b .A90 2006
|
| 100 |
0 |
|
|a Ahmad Razali Yahaya
|
| 245 |
1 |
4 |
|a The development of the test pattern generation for comparator circuit using stuck-at fault implementation
|c Ahmad Razali bin Yahaya.
|
| 260 |
|
|
|a Bestari Jaya, Selangor:
|b UNISEL,
|c 2006.
|
| 300 |
|
|
|a x, 67 p.:
|b col. ill.;
|c 30 cm.
|
| 500 |
|
|
|a Please login MyLib (library.unisel.edu.my/web/guest/mylibrary - click eDocument)
|
| 502 |
|
|
|a Thesis (Bachelor of Engineering-Electronic), UNISEL, 2006
|
| 504 |
|
|
|a Includes bibliographical references and appendix
|
| 610 |
2 |
|
|a Universiti Industri Selangor
|
| 650 |
0 |
0 |
|a Electronic circuit design
|
| 650 |
0 |
0 |
|a Electronics
|
| 997 |
|
|
|a Engineering, Faculty
|b Engineering, Department
|
| 998 |
|
|
|a Electronics Engineering, Degree
|
| 999 |
|
|
|a THE0000551
|b THESIS
|c THESIS
|e Thesis Room, Bestari Jaya
|