The development of the test pattern generation for comparator circuit using stuck-at fault implementation
| Main Author: | Ahmad Razali Yahaya |
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| Language: | English |
| Published: |
Bestari Jaya, Selangor:
UNISEL,
2006.
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| Subjects: |
| Item Description: |
Please login MyLib (library.unisel.edu.my/web/guest/mylibrary - click eDocument) |
|---|---|
| Physical Description: |
x, 67 p.: col. ill.; 30 cm. |
| Bibliography: |
Includes bibliographical references and appendix |