APA Citation
Ahmad Razali Yahaya. (2006). The development of the test pattern generation for comparator circuit using stuck-at fault implementation. Bestari Jaya, Selangor: UNISEL.
Chicago Style CitationAhmad Razali Yahaya. The Development of the Test Pattern Generation for Comparator Circuit Using Stuck-at Fault Implementation. Bestari Jaya, Selangor: UNISEL, 2006.
MLA CitationAhmad Razali Yahaya. The Development of the Test Pattern Generation for Comparator Circuit Using Stuck-at Fault Implementation. Bestari Jaya, Selangor: UNISEL, 2006.
Warning: These citations may not always be 100% accurate.