The development of the test pattern generation for comparator circuit using stuck-at fault implementation
| Main Author: | Ahmad Razali Yahaya |
|---|---|
| Language: | English |
| Published: |
Bestari Jaya, Selangor:
UNISEL,
2006.
|
| Subjects: |
Thesis Room, Bestari Jaya
| Call Number: |
TK5101 A90 2006 |
|---|
| Accession No | Item Category | SMD | Status | Notes |
|---|
| THE0000551 | THESIS | THESIS | AVAILABLE |