APA Citation

Syukri Othman. (2005). Study on NAND gate characteristic due to CMOS scaling using layout approach. Bestari Jaya, Selangor: UNISEL.

Chicago Style Citation

Syukri Othman. Study On NAND Gate Characteristic Due to CMOS Scaling Using Layout Approach. Bestari Jaya, Selangor: UNISEL, 2005.

MLA Citation

Syukri Othman. Study On NAND Gate Characteristic Due to CMOS Scaling Using Layout Approach. Bestari Jaya, Selangor: UNISEL, 2005.

Warning: These citations may not always be 100% accurate.