APA Citation

Ting, J. Y. (2007). The development of integrated circuit tester for 7400 series(7400, 7402, 7408, 7432, 7486, 747266). Bestari Jaya, Selangor: UNISEL.

Chicago Style Citation

Ting, Jong Yih. The Development of Integrated Circuit Tester for 7400 Series(7400, 7402, 7408, 7432, 7486, 747266). Bestari Jaya, Selangor: UNISEL, 2007.

MLA Citation

Ting, Jong Yih. The Development of Integrated Circuit Tester for 7400 Series(7400, 7402, 7408, 7432, 7486, 747266). Bestari Jaya, Selangor: UNISEL, 2007.

Warning: These citations may not always be 100% accurate.