The development of integrated circuit tester for 7400 series(7400, 7402, 7408, 7432, 7486, 747266)

Main Author: Ting, Jong Yih
Language: English
Published: Bestari Jaya, Selangor: UNISEL, 2007.
Subjects:

Thesis Room, Bestari Jaya

Call Number: TK7874 T56 2007
Accession No Item Category SMD Status Notes
THE0000544 THESIS THESIS AVAILABLE