Semiconductor memories : technology, testing, and reliability

Main Author: Sharma, Ashok K
Published: New York: IEEE, the Institute of Electrical and Electronics Engineers, 1997.
Subjects:

2nd Floor, Bestari Jaya

Call Number: TK7895 M4 S25 1997
Accession No Item Category SMD Status Notes
0000005592 OPEN SHELF BOK AVAILABLE