Semiconductor memories : technology, testing, and reliability
Main Author: | Sharma, Ashok K |
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Published: |
New York:
IEEE, the Institute of Electrical and Electronics Engineers,
1997.
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Subjects: |
2nd Floor, Bestari Jaya
Call Number: |
TK7895 M4 S25 1997 |
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Accession No | Item Category | SMD | Status | Notes |
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0000005592 | OPEN SHELF | BOK | AVAILABLE |