Semiconductor memories : technology, testing, and reliability

Main Author: Sharma, Ashok K
Published: New York: IEEE, the Institute of Electrical and Electronics Engineers, 1997.
Subjects:
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005 20181123090000.0
020 |a 9780780310001 (hbk.)  
020 |a 0780310004 (hbk.)  
090 0 0 |a TK7895.M4   |b S25 1997 
100 1 |a Sharma, Ashok K  
245 1 0 |a Semiconductor memories :   |b technology, testing, and reliability   |c Ashok K. Sharma. 
260 |a New York:   |b IEEE, the Institute of Electrical and Electronics Engineers,   |c 1997. 
300 |a xii, 462 p.:   |b ill.;   |c 26 cm. 
504 |a Includes bibliographical references and index 
650 0 0 |a Semiconductor storage devices  
997 |a Engineering & Life Sciences, Faculty  |b Engineering, Department 
999 |a 0000005592  |b BOK  |c OPEN SHELF  |e 2nd Floor, Bestari Jaya