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00720cam a2200181 7i4500 |
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0000005193 |
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20181123090000.0 |
020 |
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|a 9780780310001 (hbk.)
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020 |
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|a 0780310004 (hbk.)
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090 |
0 |
0 |
|a TK7895.M4
|b S25 1997
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100 |
1 |
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|a Sharma, Ashok K
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245 |
1 |
0 |
|a Semiconductor memories :
|b technology, testing, and reliability
|c Ashok K. Sharma.
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260 |
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|a New York:
|b IEEE, the Institute of Electrical and Electronics Engineers,
|c 1997.
|
300 |
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|a xii, 462 p.:
|b ill.;
|c 26 cm.
|
504 |
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|a Includes bibliographical references and index
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650 |
0 |
0 |
|a Semiconductor storage devices
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997 |
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|a Engineering & Life Sciences, Faculty
|b Engineering, Department
|
999 |
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|a 0000005592
|b BOK
|c OPEN SHELF
|e 2nd Floor, Bestari Jaya
|