Semiconductor memories : technology, testing, and reliability
| Main Author: | Sharma, Ashok K |
|---|---|
| Published: |
New York:
IEEE, the Institute of Electrical and Electronics Engineers,
1997.
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| Subjects: |
| Physical Description: |
xii, 462 p.: ill.; 26 cm. |
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| Bibliography: |
Includes bibliographical references and index |
| ISBN: |
9780780310001 (hbk.) 0780310004 (hbk.) |