Semiconductor memories : technology, testing, and reliability
| Main Author: | Sharma, Ashok K |
|---|---|
| Published: |
New York:
IEEE, the Institute of Electrical and Electronics Engineers,
1997.
|
| Subjects: |
2nd Floor, Bestari Jaya
| Call Number: |
TK7895 M4 S25 1997 |
|---|
| Accession No | Item Category | SMD | Status | Notes |
|---|
| 0000005592 | OPEN SHELF | BOK | AVAILABLE |


