Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach
by: Li, Xiaowei
A first course in digital systems design : an integrated approach
| Main Author: | Uyemura, John P |
|---|---|
| Published: |
California:
Brooks/Cole,
2000.
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| Subjects: |