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| LEADER |
00654cam a2200181 7i4500 |
| 001 |
0000002075 |
| 005 |
20191108090000.0 |
| 020 |
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|a 0471241393
|
| 090 |
0 |
0 |
|a QC611
|b .S38 1998
|
| 100 |
1 |
|
|a Schroder, Dieter K
|
| 245 |
1 |
0 |
|a Semiconductor material and device characterization
|c Dieter K. Schroder.
|
| 260 |
|
|
|a New York:
|b John Wiley & Sons,
|c 1998.
|
| 300 |
|
|
|a xxiv, 760 p.:
|b ill.;
|c 25 cm.
|
| 504 |
|
|
|a Includes bibliographical references and index
|
| 650 |
0 |
0 |
|a Semiconductors --
|x Testing
|
| 650 |
0 |
0 |
|a Semiconductors
|
| 997 |
|
|
|a Engineering & Life Sciences, Faculty
|b Engineering, Department
|
| 999 |
|
|
|a 0000011251
|b BOK
|c OPEN SHELF
|e 2nd Floor, Bestari Jaya
|
